Mitsui-san teached me how to use the spectrophotometer SolidSpec-3700 in the optic shop at ATC.

I measured reflection and transmission at 1064nm of the GaAs sample: S-I axt 8000010699 71

Sample thickness 0.4mm

Reflection = 46.77% (at 12°)

Transmission = 51.16%

Absorption = 100-R-T = 2.07%

Fujii, Hirata, Shoda

We assembled the IM for PR3 except for the wire clamps and the OSEM flags.
Please see the pictures.

The reason why we did not attach the wire clamps is the pins do not fit well. We can fix it by pushing, but if we do that, it seems difficult to remove the clamp base.
The clamp bases and clamps are paired so that the pins for alignment fit well.
But the side board, where the clamp base is attached, is not paired while the clamp base also has alignment pins.

Also, the picomotor length did not fit to the cad drawing.
I could not find why since we do not have cad file it self at that time.
We just adjust the length of the picomotor so that the the position of the moving mass is almost at the center (by eyes).

Note: one of the picomotor driver did not work well. It goes on forward, but not on backward.

I have measured the surface-map of two SiC samples (both polished) with Zygos NewView instrument.

One sample is from Kyocera and the other one from a cheaper company. For both samples it is actually quite difficult to measure the rms roughness as in both samples, the surface is featured by a lot of holes, partly having depths of 2-6 mum. Therefore, I got rms values ranging from 1 to 10 nm for both samples. Nevertheless, from the maps itself one can get the conclusion that kyoceras polishing (the first picture) is better as, apart from the holes, it looks smoother.

In order to obtain an estimation of the correction factor between bulk absorption and surface absorption on the same material (GaAs), I made some calculations.

The assumptions are a bit strong:

- the signal from the photodiode detector is proportional to the phase change of the probe beam.

- the phase change of the probe beam is proportional to the optical path change.

- the optical path change is proportional to the integral of temperature along the beam path inside the material.

I calculate the temperature distribution inside a GaAs of thickness 400micron, absorption of 12ppm on a surface of 10micron (Figure1) and absorption of 12ppm inside all the bulk 400micron (Figure2).

Calculate the integral of the temperature in dz (depth), as a function of r (radius) for both bulk and surface absorption (Figure3). Optical path change.

Divide the optical path change of bulk absorption by the optical path change of surface absorption. Plot the ratio as a function of r (Figure4).

I continued the IM assembly.

1. Attach the pin connector to the picomotors.

2. Move the picomotors and adjust its position.

3. Attach the picomotors to the base plate.

4. attach the spring and the side wall of IM box.

5. same for the upper picomotor.

*What I noticed:
- The spring is compressed a lot. So the spring winds even we have the pole inside. (the gap between the spring and the pole is not small.)
- the tube for the connection pins are too loose to be fixed at their position. At this time, I fixed the tube and the cable using the cable clamps so that the tubes do not move.
 But if we use the same tube for the other parts, we need to shrink these using a heat gun or something.

The procedure remained is connecting upper board to the base(, which needs more than two people).

The winch systems for IMs are ready in the ATC clean booth.

Members: Tatsumi, Manuel.

Big translation stage have been delivered. The company man came last thursday and today. We temporary mounted the parts on a small optical table, we configured the controllers using its software. It works properly.

Next steps before setting the big translation stage are:

 - To measure the absorption of the two Shinkousha sapphire samples that Hirose-san kindly sent to us. 

 - To make some power measurements of the pump (after and before the chopper), in order to see how the power measurement depends on the modulation frequency.

 - To understand better the beam profile of the probe beam in order to be able to make a detail design of how to move the parts of the absorption system and make enough space to place the big mirrors.

Members: Tatsumi, Manuel

Yesterday we moved many things in Tama central room from downstairs to upstairs. Picture1.jpg

Today a company came to move the optical tables. They moved the absorption measurement system optical table is inside the booth beside the stairs. Picture2.jpg

Now the floor is free (exept of the green shelves we will move soon) and ready to be repainted. Picture3.jpg

Today, the parts for upgrading the cryostat came. In particular, we have now an additional HV valve and an adapter for connecting KF25 endparts to a hose having 9mm diameter.

Still, a suitable hose is missing but I will order it Tomorrow.

I have successfully installed the items on the cryostat and are doing now test run for their vacuum performance.

Once the hose is also here, I will start the cryogenic test with He gas.

Here are now the final results on the simulations regarding the influence of the recoil mass of the PR, SR, and BS mirrors on the light scattering and the strain noise of KAGRA.
Final means that I will use these data for the publication which I am now writing.

I distinguished two different cases.
First, I assume a recoil mass made of a perfect lambertian scatterer. And second is to run the simulations with the BRDF data of titanium (roughly polished) which will be closest to reality.

The two last pictures are for BS, backside.

It should be noted that the data in the figures are given in 1/(sqrt(Hz) sr) and have to be multiplied by the respective solid-angle toward the beams waist to be comparable with KAGRAs goal sensitivity!
This will further decrease the values (by a magnitude of 10, or so), so I decided to leave the data as they are to keep a good overview of their relation to KAGRAs goal sensitivity.
 

It can be seen that even for the BS, we only have a neglible effect on the strain noise due to the scattering on the recoil mass, which is of course a good sign.

It would be nice if you check the polarization of the incident lights; maybe it would be different between the JASMINE one and the backscattering measurement system.

I measured the absorption  at many modulation frequencies and plot the results in logaritmic scale.

I measured:

 - Sapphire sample

 - Reference sample: Bulk

 - Reference sample: Surface

I present here the results of my own measurements on the polished SiC sample from Kyocera.
The measurements were done after Iwata-san did his measurements and after I did a necessary readjustment of the hight and the orientation of the laser.

The data show now a relatively equal maximum due to specular reflection, limited, of course, by the angular resolution of the system (-> 1 deg).
I added some roughly read data from Iwata-sans Backscattering measurements.
It is interesting to note that they are for all angles bigger than the JASMINE data would imply. At least for the maximum at AOI=0, it might be a true value. However, I am skeptical that the other values (all at around 0.02) are due to pure backscattering. Actually, I guess that noise is the main factor for their values...

The next step will be the measurement of the non-polished side of SiC.

I coded a Matlab script to evalue the analitic solution of the temperature distribution reported on the paper of Jackson et al.

I show the plot of T along z (depth) and r (radius)

Laser power = 1W

Surface:

absorption = 12ppm;

coating thickness = 10micron;

Bulk:

absorption = 20ppm/cm

thickness = 5mm;

Befor mesuring the Sapphire sample I made once again the calibration of the bulk reference sample (Schott glass#12 Abs=116%/cm) with low power 55mW and I found a calibrtion factor R=0.43W-1 (about 10% smaller than usually).

I measure the absorption of the Sapphire sample.

Pump power = 9.5W (maximum avaulable)

The scan along the Z axis Figure1 and Figure2 shows that the absorption value is 18 ppm/cm. The value has to be taken at the lowest inner point which is at Z=6mm in this case.

Then I moved the sample to that Z position and I made a map of 20x20mm with a resolution of 2x2mm.

I made it twice to check the repeatability (Figure3 and Figure4 ), and then I plot the difference Figure5 which is about the noise level: 1ppm/cm,

I made a higher resolution map  1x1mm (See Figure6).

An OSEM test bench in the ATC ISO-1 clean room is assembled by ATC people (Ikenoue-san and Saito-san).

These are now the results of the second round for the Ti sample. I rotated the sample by 90 degrees and measured its scattering again.
As can be seen, the peaks are much more sharper and more regular/symmetric compared to the non-rotated sample.
The strange shape of the AOI=0 curve is due to the interpolation process of the data gap (PD cuts off the Laser light) and the fact that I used one data point at theta=0 from older backscattering measurements.I need the interpolation for the implementation of the data into LightTools.

About BS oplev, its optical axis will be vertical, so it is relatively difficult for adults; maybe easier for japanese elementary school students.

One notice on this system is the angle of the axis is 37 degrees. Newport is selling adapters for 45 degrees for their mirror holders, which has a range of +/-7degrees, and that means even the combination of the adapter and the mirror holder cannot cover 37 degrees!!!!

Hmm, well, maybe I'll design a stuff...

Since bulk sample from LMA are rectangular, we needed a rectangular mount. We ordered the parts to be assembled and, after some trouble with metric and imperial lengths and screw threads, we succeded attach the magnets at the mount properly. (See Figure1 and Figure2 )

The sample of suprasil312 has a thickness of 20mm and a nominal absorption of 1.5-1.6ppm/cm.

I used the maximum power available setting the LD current at 7.5A. The measured power at the end of the pump path is 9.3W. I used the calibration factor R = 0.51 1/W  which was measured on the high absorbing reference sample.

The scan along the z axis shows that the  first surface is not absorbing but the second surface gives a big signal (600ppm). See Figure3 and Figure4.

Figure5 is a zoom of figure4 and it show the absorption inside the bulk (between 2 and 15mm) which has a value of 4ppm, while the noise outside the bulk is about 1ppm. This means that the measured absorption is 3ppm. About the double of the nominal value.

Members: Tatsumi, Hirose, Manuel

We went to Kashiwa campus on wednesday and we glued the wire breakers and the flags on the spare mirror.

I attach some pictures:

Figure1: Pour the first contact on the surface

Figure2: Spread the first contact

Figure3: Attach the little mesh to later remove the film.

Figure4: Set the mirror on the glueing rotating table. The arrow indicates the HR surface facing downward.

Figure5: Set the stages

Figure6: Set the lenses and rotate the table to be sure the white lines are aligned. Then remove the lenses.

Figure7: Put glue on the bigger wire breaker

Figure8: Put glue on the smaller wire breaker

Figure9: Fix the wire breakers on the stage

Figure10: Approach and attach the wire breakers to the surface using the micrometer screw

Figure11: Detail of the wire breaker

Figure12: Set the upper table and fix the flag mounts without glue to be sure they contact the surface

Figure13: Put  glue on the flags

Figure14: Paste the flags

Figure15: All flags are set