DECIGO (General)
SimonZeidler - 20:32, Friday 20 May 2016 (243)
SiC samples back from outgassing measurements

We got the SiC samples back from KEK last week. Unfortunately, I discovered some dark spots on the polished surface on at least 3 of 7 samples. 

The pictures below show these spots on a NFC (first picture) and Covalent (second one) sample.

Images attached to this report
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